Accession Number : AD0056364

Title :   PRECISION DETERMINATION OF LATTICE CONSTANTS WITH A GEIGER-COUNTER X-RAY DIFFRACTOMETER

Corporate Author : MASSACHUSETTS INST OF TECH CAMBRIDGE LAB FOR INSULATION RESEARCH

Personal Author(s) : SMAKULA, A. ; KALNAJS, J.

Report Date : FEB 1955

Pagination or Media Count : 1

Descriptors :   *NUCLEAR RADIATION SPECTROMETERS, *SINGLE CRYSTALS, *X RAY DIFFRACTION, CRYSTAL LATTICES, GEIGER COUNTERS, GONIOMETERS.

Distribution Statement : APPROVED FOR PUBLIC RELEASE