Accession Number : AD0148239

Title :   OXYGEN IMPURITY IN SILICON SINGLE CRYSTALS

Corporate Author : MASSACHUSETTS INST OF TECH CAMBRIDGE LAB FOR INSULATION RESEARCH

Personal Author(s) : SMAKULA, A. ; KALNAJS, J.

Report Date : NOV 1957

Pagination or Media Count : 1

Descriptors :   *SILICON, ANALYSIS, DETECTION, IMPURITIES, INFRARED SPECTROSCOPY, OXYGEN, SINGLE CRYSTALS, SPECTROGRAPHIC ANALYSIS.

Distribution Statement : APPROVED FOR PUBLIC RELEASE