Accession Number : AD0163655

Title :   Method and Apparatus for Obtaining High-Resolution X-Ray Interference Patterns.

Descriptive Note : Patent,

Corporate Author : OFFICE OF THE SECRETARY OF THE ARMY WASHINGTON D C

Personal Author(s) : Willett,Colin S.

Report Date : 21 DEC 1971

Pagination or Media Count : 5

Abstract : The invention relates to X-ray interferometers and more particularly to a device and method for the precision measurement of X-ray absorption edges and emission lines in the X-ray spectral region.

Descriptors :   (*INTERFEROMETERS, X RAYS), (*PATENTS, INTERFEROMETERS), X RAY SPECTRA, SPECTRUM ANALYZERS

Subject Categories : Test Facilities, Equipment and Methods
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE