Accession Number : AD0164046
Title : Microcircuit Test Probe with Grappler.
Descriptive Note : Patent,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C
Personal Author(s) : Gick,Eugene E.
Report Date : 10 MAR 1970
Pagination or Media Count : 3
Abstract : The patent provides a simple device for testing microelectronic components without causing breakage or short circuits. The invention is a test probe to hook onto or into a circuit, particularly a microcircuit, without discontinuing the current flow within the circuit. A tapered plug which normally is spring biased into abutment with a hook portion of the contact end of the test probe is manually withdrawn to expose the hook portion for enabling engagement with the circuit.
Descriptors : (*PROBES(ELECTROMAGNETIC), *INTEGRATED CIRCUITS), (*PATENTS, PROBES(ELECTROMAGNETIC)), MICROELECTRONICS, TEST EQUIPMENT
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE