Accession Number : AD0164046

Title :   Microcircuit Test Probe with Grappler.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C

Personal Author(s) : Gick,Eugene E.

Report Date : 10 MAR 1970

Pagination or Media Count : 3

Abstract : The patent provides a simple device for testing microelectronic components without causing breakage or short circuits. The invention is a test probe to hook onto or into a circuit, particularly a microcircuit, without discontinuing the current flow within the circuit. A tapered plug which normally is spring biased into abutment with a hook portion of the contact end of the test probe is manually withdrawn to expose the hook portion for enabling engagement with the circuit.

Descriptors :   (*PROBES(ELECTROMAGNETIC), *INTEGRATED CIRCUITS), (*PATENTS, PROBES(ELECTROMAGNETIC)), MICROELECTRONICS, TEST EQUIPMENT

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE