Accession Number : AD0165084

Title :   Roughness Analyzer.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C

Personal Author(s) : Bennett,Harold E.

Report Date : 13 NOV 1973

Pagination or Media Count : 5

Abstract : The patent describes a device for measuring surface irregularities of an optical surface.

Descriptors :   *Measuring instruments, *Patents, Surface roughness, Light scattering

Subject Categories : Test Facilities, Equipment and Methods
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE