Accession Number : AD0229868

Title :   PERARYLATED SILANES. IDENTIFICATION BY X-RAY DIFFRACTION POWER PATTERNS

Corporate Author : AEROSPACE RESEARCH LABS WRIGHT-PATTERSON AFB OH

Personal Author(s) : CHAN, FRANK L. ; SPIALTER, LEONARD

Report Date : SEP 1959

Pagination or Media Count : 1

Descriptors :   *X RAY DIFFRACTION, CRYSTALS, MICROPHOTOMETERS, PHOTOGRAPHIC ANALYSIS, QUANTITATIVE ANALYSIS, SILANES.

Distribution Statement : APPROVED FOR PUBLIC RELEASE