Accession Number : AD0258384

Title :   STRUCTURE OF DEFECT CLUSTERS IN SOLIDS

Corporate Author : IIT RESEARCH INST CHICAGO ILL

Personal Author(s) : BUTTREY,JOHN W.

Report Date : 12 MAY 1961

Pagination or Media Count : 1

Abstract : Preliminary results have been achieved on a small angle scattering study of defect clustering in irradiated single crystals. Silicon single crystals irradiated to a total of 2 x 10 to the 19th power nvt fast neutron flux fail to show any small angle scattering. Some small angle x-ray scattering was detected from a lightly irradiated sample of LiF, but preliminary results from a lithium-doped silicon single crystal are negative, even though it was thought to contain 100 A clusters of pure lithium metal. Such clusters should be detectable using small angle x-ray diffraction; no conclusive reasons are apparent why this sample did not show small angle scattering. Scattering intensity calculations are treated in an appendix. (Author)

Descriptors :   *FLUORIDES, *LITHIUM COMPOUNDS, *SCATTERING, *SOLIDS, *X RAY DIFFRACTION, CRYSTAL LATTICES, CRYSTAL STRUCTURE, FAST NEUTRONS, LITHIUM, NEUTRONS, PARTICLES, SILICON, SINGLE CRYSTALS, SOLID STATE PHYSICS

Distribution Statement : APPROVED FOR PUBLIC RELEASE