Accession Number : AD0262912

Title :   BACKGROUND INTENSITIES IN SINGLE CRYSTAL DIFFRACTOMETRY

Corporate Author : GEORGIA INST OF TECH ATLANTA ENGINEERING EXPERIMENT STATION

Personal Author(s) : YOUNG,R.A.

Report Date : 12 JUL 1961

Pagination or Media Count : 1

Abstract : The question of the component parts and character of the background in X-ray diffraction was reexamined in some detail. The components are divided into two classes: (1) those which may be peaked at the Bragg position, principally the harmonic components and (2) those which do not peak at the Bragg position, here called the miscellaneous components. An expression is presented for the dependence of the harmonic contributions on counter aperture, structure factors, Bragg angle, temperature, and other parameters. The qualitative correctness of the expression is demonstrated by experimental results. The control and measurement of the miscellaneous component is also considered. Particular attention should be given to the counter aperture size and to both incident and receiving collimators even with the large beam used in single crystal diffractometry. Detailed procedures for correct background determination with balanced filters are presented. While the present discussion is concerned principally with single crystal diffractometry, implications to film methods and to powder diffractometry are also pointed out. (Author)

Descriptors :   *SINGLE CRYSTALS, *X RAY DIFFRACTION, BAND PASS FILTERS, COLLIMATORS, CRYSTAL COUNTERS, DIFFRACTION, HARMONIC ANALYSIS, MEASUREMENT, PULSE HEIGHT ANALYZERS, QUARTZ, SCATTERING, SCINTILLATION COUNTERS, SPECTROGRAPHIC ANALYSIS, TEMPERATURE, X RAYS

Distribution Statement : APPROVED FOR PUBLIC RELEASE