Accession Number : AD0271050

Title :   SEMICONDUCTOR RESISTIVE ELEMENT

Corporate Author : TEXAS INSTRUMENTS INC DALLAS

Report Date : JAN 1962

Pagination or Media Count : 1

Abstract : Efforts were made to develop a low temperature coefficient of resistance (TCR) semiconductor resistive element with more stable characteristics and greater reliability than the metal film resistors presently on the market. Several semiconductor materials (reduced ttania, silicon carbide, silicon boride, gallium arsenide, etc.) were considered as bulk elements and for various reasons were rejected. The elements thought most promising were silicon layer configurations formed either by diffusion or by vapor deposition. Silicon layer elements in the preliminary stages of development exhibited TCR's as low as 350 ppm at resistivities of approximately 0.0X ohm-cm. Load life and TCR data are presented for both the standard network devices and the experimental silicon diffused, epitaxial and polycrystalline elements. (Author)

Descriptors :   *RESISTORS, *SEMICONDUCTORS, ANTIMONY ALLOYS, ARSENIDES, BORIDES, CARBIDES, CRYSTALS, DIOXIDES, GALLIUM COMPOUNDS, IMPURITIES, INDIUM COMPOUNDS, LEAD COMPOUNDS, MATERIALS, SELENIUM COMPOUNDS, SILICON, SILICON COMPOUNDS, SINGLE CRYSTALS, TELLURIDES, TITANIUM COMPOUNDS

Distribution Statement : APPROVED FOR PUBLIC RELEASE