Accession Number : AD0271727

Title :   PRODUCTION ENGINEERING MEASURE FOR VARIABLE CAPACITOR DIODES

Corporate Author : TRW SEMICONDUCTORS INC LAWNDALE CALIF

Personal Author(s) : CLARKE,R.N.

Report Date : 1961

Pagination or Media Count : 1

Abstract : A study was made of direct capacitance ratio display equipment, the more accurate capacitance measurement equipment, and the fast capacitance and figure of merit measurement equipment. Also of interest was the disposition of the etching technique. The direct capacitance ratio display proved impractical, since the state of the art of a single capacitance measurement was difficultAND NOT SUITABLE FOR COMPARISON WITH ANOTHER SINGLE MEASUREMENT OF CAPACITANCE. The more accurate measurement of capacitance and figure of merit has been attained through the use of the capacitance bridge. The fast measurement of capacitance and figure of merit approach, through the delta f method, proved impractical due to the subtleties of obtaining a high figure of merit reference circuit which could be successfully incorporated into a practical instrument. The particular handling system and etching technique proved impractical since the materials necessitated by the etch process were impractical in the associated environments. (Author)

Descriptors :   *CAPACITANCE, *DIODES, *DISPLAY SYSTEMS, *INSTRUMENTATION, *VARIABLE CAPACITORS, CAPACITANCE BRIDGES, MANUFACTURING, MEASUREMENT, PRODUCTION, TEST EQUIPMENT, TEST METHODS, TEST SETS

Distribution Statement : APPROVED FOR PUBLIC RELEASE