Accession Number : AD0276659

Title :   REPRODUCIBLE THERMISTOR REFINEMENT PROGRAM

Corporate Author : GRACE (W R) AND CO CLARKSVILLE MD

Personal Author(s) : VANIK,M.C. ; BARRETT,W.T.

Report Date : JUN 1962

Pagination or Media Count : 1

Abstract : Thermal instability of gold-doped monocrystalline silicon thermistors arose as a problem just prior to the operation of the pilot line. Annealing and improvements in the contact process should be the answer to this problem. In P-type silicon the resistivity of the float zone-leveled product increases as the resistivity of the starting P-type silicon increases. This relationship will be useful for production purposes. The time constants of our thermistors compare favorably with that of the AMT-4 radiosonde thermistor. Thermistors coated with silicone enamel and silicone rubber in thin films had smaller time constants than the radiosonde thermistor. All thermometers were calibrated against an N.B.S. calibrated platinum resistance thermometer. This calibration revealed some large but relatively constant errors in the toluene thermometers measuring below 0 C. Nickel resistance thermometers are being used. Two techniques have been tried to effect the final size adjustment of the thermistors. Vapor blasting was discarded because of cooling effects while cutting. Miniature high-speed grinding works well and will be used for production purposes. (Author)

Descriptors :   *SEMICONDUCTORS, *SILICON, *SINGLE CRYSTALS, *THERMISTORS, GOLD, IMPURITIES, MANUFACTURING, PRODUCTION, RELIABILITY, REPRODUCTION, SENSITIVITY, TEMPERATURE SENSITIVE ELEMENTS

Distribution Statement : APPROVED FOR PUBLIC RELEASE