Accession Number : AD0277154

Title :   PROPOSAL OF NEW METHOD FOR THE PRECISION MEASUREMENT OF FRACTIONAL BIREFRINGENCE IN PHOTOELASTICITY

Corporate Author : BOEING SCIENTIFIC RESEARCH LABS SEATTLE WASH

Report Date : APR 1962

Pagination or Media Count : 1

Abstract : For most work in transmitted light photoelasticity, the Tardy and Senarmont methods (Brit. J. Appl. Phys. 4:138-141, 1953) have superseded the compensator method of measuring the fractional birefringence, since they require no apparatus other than a standard polariscope, are more convenient in operation, and generally are capable of greater accuracy. The scattered light technique provides a non-destructive method in threedimensional stress analysis and a foundation for three-dimensional photoplasticity. However, in this technique, the scattering property of the model material acts as an analyzer and the Tardy and Senarmont methods cannot be used. The only means heretofore available for the measurement of fractional birefringence with scattered light has been the compensator method. In this investigation, a new method is proposed for its precision measurement without employing the compensator. The results show that this technique is also applicable to transmitted light photoelasticity. (Author)

Descriptors :   *PHOTOELASTICITY, OPTICS, REFRACTION

Distribution Statement : APPROVED FOR PUBLIC RELEASE