Accession Number : AD0278832

Title :   SERIES AND PARALLEL ARRANGEMENTS OF ELECTRICALLY INITIATED EXPLOSIVES

Corporate Author : NAVAL WEAPONS LAB DAHLGREN VA

Personal Author(s) : GRAY,R.I.

Report Date : JUL 1962

Pagination or Media Count : 1

Abstract : THE OVER-ALL ELECTRICAL RELIABILITY OF ANY SYSTEM IN WHICH COMPONENT INPUTS ARE INTER-CONNECTED CAN BE DERIVED FROM A MODIFIED FORM OF THE BINOMIAL PROBABILITY THEOREM USING THE FUNCTIONAL RELATIONSHIP OF THE OUTPUTS TO DETERMINE THE RELEVANT GROUP PROBABILITY. IN APPLYING THIS THEORY TO WIRE BRIDGE FUZES (SQUIBS) IT IS FOUND THAT IF SHORT-CIRCUIT INPUT DEFECTS ARE EQUALLY LIKELY, A SERIES INPUT ARRANGEMENT IS MORE RELIABLE ELECTRICALLY, THAN IS A PARALLEL ARRANGEMENT,WHICH IS PERHAPS CONTRARY TO COMMON BELIEF. WHEN THE ELECTRICALDEFECT PROBABILITIES ARE VERY SMALL A SERIES ARRANGEMENT IS MORE OR LESS RELIABLE THAN A PARALLEL ARRANGEMENT ACCORDING AS THE PROBABILITY OF A SHORT-CIRCUIT IS GREATER OR LESS THAN THAT OF AN OPEN-CIRCUIT

Descriptors :   PROBABILITY, RELIABILITY, WIRING DIAGRAMS

Distribution Statement : APPROVED FOR PUBLIC RELEASE