Accession Number : AD0281873

Title :   HANDBOOK. RELIABILITY AND APPLICATION DATA FOR TRANSISTORS USED IN MISSILE ELECTRONIC SYSTEMS,

Corporate Author : ARINC RESEARCH CORP WASHINGTON D C

Personal Author(s) : VON Alven ,W. H. ; Dellinger,A. J.

Report Date : 01 DEC 1961

Pagination or Media Count : 269

Abstract : A handbook is presented of reliability and application information on transistors used in military equipment. Typical variations of electrical parameters over a wide range of operating conditions are given for 14 selected transistor types. The information is presented in a form usable by production engineers for the improvement of reliability of transistorized equipment. Significant findings from sequential-environment life tests and recommended additions to pertinent military specifications are discussed. Typical characteristics and product variability are summarized at three discrete temperatures for the 14 transistor types. Also included are transistor behavior characteristics, as established through sequential-environment and multiple-level life tests; and reliability diagrams based on data supplied by various manufacturers of transistors. (Author)

Descriptors :   *HANDBOOKS, *TRANSISTORS, CIRCUITS, ELECTRICAL PROPERTIES, GUIDED MISSILES, LIFE EXPECTANCY, SILICON, SWITCHING CIRCUITS, TEMPERATURE, TESTS, TRANSISTOR AMPLIFIERS

Distribution Statement : APPROVED FOR PUBLIC RELEASE