Accession Number : AD0282365

Title :   FAILSAFE CIRCUITS

Corporate Author : ILLINOIS UNIV URBANA DIGITAL COMPUTER LAB

Personal Author(s) : HILL,JOHN

Report Date : 22 JUN 1962

Pagination or Media Count : 1

Abstract : The concept of failsafe circuits stems from the wish to have circuits with a higher reliability than the individual component reliabilities will allow. Failsafe circuits extend over-all circuit reliability by allowing certain component failures inside the circuit. In the circuits considered, the physical components are resistors, capacitors, inductors, connecting wires and transistors. However, in the circuit construction and in the mathematical analysis, the primary concern is with single transistor failures. This assumption that only transistors fail is based on the idea that resistors, capacitors and connections of arbitrarily good reliability can be procured, but that there is usually a particular reliability limit in the high-speed transistors. It will be seen that the failsafe circuits can withstand any single resistor, capacitor, or transistor failure, and that the failure indicator will signal any resistor or transistor which has ceased to operate. (Author)

Descriptors :   *CIRCUITS, CATHODE FOLLOWERS, COMPUTER LOGIC, DELAY LINES, DIGITAL COMPUTERS, FAILURE (MECHANICS), LIFE EXPECTANCY, PULSE COUNTERS, RADIOFREQUENCY AMPLIFIERS, RADIOFREQUENCY OSCILLATORS, RELIABILITY, TIMING CIRCUITS

Distribution Statement : APPROVED FOR PUBLIC RELEASE