Accession Number : AD0282525

Title :   AUTOMATIC TESTING SYSTEM

Corporate Author : HARRY DIAMOND LABS WASHINGTON D C

Personal Author(s) : BRENNER,MORRIS

Report Date : 25 JUL 1962

Pagination or Media Count : 42

Abstract : A system for the automatic testing of electronic devices has been designed. It is applicable to the measurement of test parameters that are available as dc voltages or can be converted to dc voltage prior to injection into the system. It memorizes n parameters simultaneously and then records them sequentially on IBM cards or tape. (A prototype for 10 parameters has been constructed.) Voltage comparators indicate the relation of the test data being recorded to specification requirements by lighting of the appropriate lamp to show go, high, or low. As a universal-type testing device for both R+D and production it offers significant advantages with respect to accuracy, reliability, costs, and efficient utilization of test personnel. The system, with the exception of the specially built memory circuitry, can be assembled from commercially available equipment. Operation has been checked out against static sources such as battery-operated voltage dividers and active sources such as guided missile fuzes with satisfactory results. (Author)

Descriptors :   *GUIDED MISSILE FUZES, *TEST EQUIPMENT, AUTOMATIC, MEMORY DEVICES, DATA STORAGE SYSTEMS, ELECTROMAGNETIC FUZES, ELECTRONIC EQUIPMENT, FUZES (ORDNANCE), TEST METHODS, TESTS

Distribution Statement : APPROVED FOR PUBLIC RELEASE