Accession Number : AD0282722

Title :   MOLECULAR CIRCUIT DEVELOPMENT

Corporate Author : MELPAR INC FALLS CHURCH VA

Personal Author(s) : LAYTON,WILBUR T.

Report Date : 15 AUG 1962

Pagination or Media Count : 86

Abstract : This report includes: Fullam, Ernest F., Inc., Schenectady, N. Y. ELECTRON DIFFRACTION ANALYSIS OF EVAPORATED FILMS. 9 July 62. Research continued on thin-film circuits and systems in which electronic circuit elements are integrated in a material matrix to a point where individual elemental appearances have been lost. The circuits will be capable of operating at 500 C., and should possess a high degree of radiation resistance. The circuits, as conceived, will contain microareas within a single film and/or be formed of layers of metals, semiconductors, and dielectrics in preconceived conceived configurations to provide the necessary electronic functions. The objective is to be accomplished by performing studies of film and microcrystal formation, surface and interfacial phenomena, and geometric studies of configurations to use, to the maximum advantage, the physical effects that occur in thin films. The electronic circuits so formed will possess a maximum degree of microminiaturization. (Author)

Descriptors :   *CIRCUITS, *DIELECTRIC FILMS, *MICROMINIATURIZATION (ELECTRONICS), *MOLECULAR ELECTRONICS, *SEMICONDUCTING FILMS, CRYSTAL STRUCTURE, CRYSTALS, DIELECTRIC PROPERTIES, ELECTRIC FIELDS, ELECTRICAL PROPERTIES, GERMANIUM, GROWTH(PHYSIOLOGY), INTERMETALLIC COMPOUNDS, PREPARATION, PYROGENS, REFRACTORY MATERIALS, SILICON, SINGLE CRYSTALS, STABILITY, THICKNESS, VACUUM APPARATUS, VAPOR PLATING

Distribution Statement : APPROVED FOR PUBLIC RELEASE