Accession Number : AD0284175

Title :   INDUSTRIAL PREPAREDNESS STUDY ON DEVICES 13, 14, 15 EXTENDED LIFE TEST 5000 HOUR DATA REPORT,

Corporate Author : RADIO CORP OF AMERICA SOMERVILLE N J

Personal Author(s) : WRIGHT,J.

Report Date : MAR 1962

Pagination or Media Count : 1

Abstract : Presented is the status of the extended life test program involving transistor types 2N1484, 2N1480 and 2N1488 at the 5000 hour interval. The effects of storage at various temperatures and power dissipation levels of power transistors out to 5000 hours are included. Static operating circuits used in this program are shown. All data to 5000 hours is shown in graphical form. (Author)

Descriptors :   *TRANSISTORS, AGING (PHYSIOLOGY), DEGRADATION, EXPERIMENTAL DATA, LIFE EXPECTANCY, SILICON, STORAGE, TEMPERATURE

Distribution Statement : APPROVED FOR PUBLIC RELEASE