Accession Number : AD0284693

Title :   NOISE MEASUREMENTS AS A TOOL IN ELECTRON DEVICE RESEARCH

Descriptive Note : Quarterly progress rept. no. 10, 1 Apr-30 Jun 62

Corporate Author : MINNESOTA UNIV MINNEAPOLIS ELECTRON TUBE RESEARCH LAB

Personal Author(s) : VAN DER ZIEL, A.

Report Date : 30 JUN 1962

Pagination or Media Count : 1

Abstract : Work on noise in image orthicons was completed. The current leaving the photocathode shows full shot noise. The readout beam shows full shot noise for the frequency r gion of interest. The oise in the first dynode is larger than would be anticipated from a Poisson distribution of the electron emission. Low-noise amplifiers were developed that have 25-50 ohms equivalent noise resistance at the input of the first stage. Additional data was obtained on the noise in Al-Al2O3-Al sandwiches. The results agree with earlier observations. The noise measurements on indium-doped CdS crystals were extended o different samples. Additional measurements have been performed on noise in the light emission of MgO cold cathodes. Noise in the electron emission has been determined. (Author)

Descriptors :   *CAMERA TUBES, *CATHODES (ELECTRON TUBES), *ICONOSCOPES, *NOISE (RADIO), CRYSTALS, DIODES, ELECTRON BEAMS, ELECTRON GUNS, EQUATIONS, FOCUSING, IMAGE TUBES, IMPURITIES, INDIUM, MEASUREMENT, PHOTOELECTRIC EFFECT, PHOTOMULTIPLIER TUBES, POWER AMPLIFIERS, PREAMPLIFIERS, SECONDARY EMISSION, SIGNAL-TO-NOISE RATIC, TESTS, THEORY.

Distribution Statement : APPROVED FOR PUBLIC RELEASE