Accession Number : AD0286305

Title :   STUDY OF SHORT TERM STABILITY OF CRYSTAL OSCILLATORS

Corporate Author : NEW YORK UNIV N Y SCHOOL OF ENGINEERING AND SCIENCE

Personal Author(s) : SAPORTA,L. ; WEISS,G.

Report Date : 30 JUN 1962

Pagination or Media Count : 1

Abstract : A study is described of the effects of noise on the r.m.s. frequency deviation of an oscillator. Several models are assumed. In one case the noise and signal are linearly added and the assumption is made that the noise does not enter the feedback loop o the oscillator. It is shown that this predicts an inverse first power variation of the r.m.s. frequency deviation with respect to the integration time inherent in the frequency measurement. In other models, the noise is included in the feedback loop and results in an inverse one-half power variation. Evidence is adduced to indicate that both effects take place in practical oscillators and some estimates of the magnitude of these effects are made. (Author)

Descriptors :   *CRYSTAL OSCILLATORS, *OSCILLATORS, FREQUENCY STABILIZERS, LINEAR SYSTEMS, MATHEMATICAL ANALYSIS, MEASUREMENT, MODEL TESTS, NONLINEAR SYSTEMS, RADIOFREQUENCY AMPLIFIERS, SIGNAL-TO-NOISE RATIC, TUNED CIRCUITS

Distribution Statement : APPROVED FOR PUBLIC RELEASE