Accession Number : AD0286907

Title :   PEM FOR TRANSISTOR MANUFACTURING PROCESS IMPROVEMENT

Corporate Author : PHILCO CORP LANSDALE PA

Personal Author(s) : SANDERS,J.

Report Date : 31 JUL 1962

Pagination or Media Count : 1

Abstract : A production engineering measure was studied for improvement of production techniques to increase the reliability for the jet etch transistor type 2N501A, with a maximum operating failure rate of 0.01% per 1000 hours at a 90% confidence level at 25 C as an objective. Efforts were made to improve the following seven manufacturing processes: (1) plating edge definition, (2) higher temperature alloys, (3) lead attachments (includes collector attachments), (4) controlled formation of surface oxides for surface stabilization, (5) gettering techniques for encapsulating and sealing, (6) thermal dissipation of package, and (7) leak determination. Establishment of a pilot line to incorporate these process improvements is reported. Preliminary operating stress data o transistors fabric ted on the pilot line indicates an improvement in power handling capability as a result of the process improvements completed. Problems associated with operating stress testing and with obtaining correlation between operating stress testing and storage stress testing are discussed. (Author)

Descriptors :   (*TRANSISTORS), (*MANUFACTURING METHODS), RELIABILITY, STRESSES, STORAGE, OPERATION, ENCAPSULATION, ELECTRODES, TEMPERATURE, SEALS(STOPPERS), DEGASIFICATION, CHEMICAL MILLING, HIGH TEMPERATURE, PRODUCTION

Distribution Statement : APPROVED FOR PUBLIC RELEASE