Accession Number : AD0287870

Title :   RELIABILITY OF SEMICONDUCTOR DEVICES

Corporate Author : ARINC RESEARCH CORP WASHINGTON D C

Personal Author(s) : BLAKEMORE,GEORGE J.

Report Date : 31 OCT 1962

Pagination or Media Count : 1

Abstract : Life-test data on 13 of the 23 specified semiconductor device types were obtained. nalysis of one of these types was completed, and the results are included. Collection of field reliability data on transistors and transistorized equipment has started. Computer programming was completed for the Monte Carlo technique that is being used for placing confidence bands around the Weibull shape parameter. Analysis of the computer output was begun, and preliminary reults are reported. he analysis consists of 4 parts: (1) disribution of electrical parameter readings at different time periods; (2) distribution of the change in electrical parameter readings at 1000 hours relative to the initial readings (dela distributions); (3) graphical estimation of the Weibull distribution shape parameter and scale parameter; and (4) determination of hazard rates based on the estimated Weibull parameters. (Author)

Descriptors :   *RELIABILITY, *SEMICONDUCTORS, ANALYSIS, ELECTRICAL PROPERTIES, EXPERIMENTAL DATA, LIFE EXPECTANCY, MEASUREMENT, NUMERICAL METHODS AND PROCEDURES, PROBABILITY, STATISTICAL ANALYSIS, STORAGE, TEST METHODS, THEORY

Distribution Statement : APPROVED FOR PUBLIC RELEASE