Accession Number : AD0288632

Title :   AN APPROACH TO MORE ACCURATE RELIABILITY ANALYSES OF TRANSISTORS

Corporate Author : ARMY ELECTRONICS LABS FORT MONMOUTH N J

Personal Author(s) : REICH,BERNARD

Report Date : AUG 1962

Pagination or Media Count : 1

Descriptors :   *RELIABILITY, *SEMICONDUCTORS, *TRANSISTORS, LIFE EXPECTANCY, STORAGE, TEMPERATURE, TEST METHODS, TESTS

Distribution Statement : APPROVED FOR PUBLIC RELEASE