Accession Number : AD0291047

Title :   Combined Environmental Testing of Semiconductor Devices.

Descriptive Note : Quarterly progress rept. no. 6,

Corporate Author : BURROUGHS CORP PHILADELPHIA PA

Personal Author(s) : LONG, ALTON L.

Report Date : 1962

Pagination or Media Count : 55

Abstract : The object of this study is to ascertain whether the combined environmental effects of temperature and pulsed nuclear (gamma and neutron) radiation on semiconductor devices are simply the sum of the two single effects or a complex interaction of the two, and, to develop a theoretical explanation of the observed phenomena

Descriptors :   *SEMICONDUCTOR DEVICES, *ENVIRONMENTAL TESTS, *RADIATION DAMAGE, ARMY RESEARCH, TEMPERATURE, PULSES, NUCLEAR RADIATION, INTERACTIONS, GAMMA NEUTRON REACTIONS.

Subject Categories : Electrical and Electronic Equipment
      Nuclear Weapons

Distribution Statement : APPROVED FOR PUBLIC RELEASE