Accession Number : AD0291751

Title :   STUDY OF METHODS FOR IMPROVING THE QUALITY OF SYNTHETIC QUARTZ

Corporate Author : CLEVITE CORP CLEVELAND OHIO

Personal Author(s) : HALE,D.R. ; CARLSON,A.E. ; KRUEGER,H.H.A.

Report Date : 11 DEC 1962

Pagination or Media Count : 1

Abstract : The X-ray diffraction scanning camera was successfully used to obtain pictures of the dislocation patterns in quartz wafers. Dislocation densities observed were estimated to range from zero to 10 to the 4th power lines/sq cm, with wide local variations in density, as well as pattern, often found within a single quartz plate. r artz crystals of known Q values, data is still too meager to positively con irm or deny a correlation with density or other attributes of dislocations. Precision 5 Mc resonators from 3 synthetic crystals and a natural crystal were measured from room temperature to -196 (liquid N). One of the synthetic crystals yields a Q relatively flat to the l temperature, the others yield Q(-1) which increases most of a decade as the low temperature is approached. Vis ally clear quartz cr stals were obtained in everal growth experiments involving Z-growth nutrient; devitrified nutrient of special purity yielded in general cracked Zgrowth. IR a sorption of several pecimens has been under tudy. (Author)

Descriptors :   *QUARTZ, ABSORPTION, CRYSTAL LATTICES, CRYSTAL STRUCTURE, IMPURITIES, INFRARED RADIATION, MANUFACTURING, OPTICAL ANALYSIS, PREPARATION, QUARTZ RESONATORS, TEST EQUIPMENT, X RAY DIFFRACTION, X RAY DIFFRACTION CAMERAS, X RAY PHOTOGRAPHY

Distribution Statement : APPROVED FOR PUBLIC RELEASE