Accession Number : AD0291832

Title :   PRODUCTION ENGINEERING MEASURE TYPE 2N1016B SILICON ALLOY TRANSISTOR

Corporate Author : WESTINGHOUSE ELECTRIC CORP PHILADELPHIA PA

Personal Author(s) : CHINOWSKY,S. ; CSAKVARI,T.

Report Date : 30 SEP 1962

Pagination or Media Count : 1

Abstract : A program aimed at improved reliability of high power silicon alloy transistors is described. Phases of the project inclu e redesign of some comp nents of the device, re inement or redesign of processes, and improved control of fabrication and internal device environments. Definite improvement of the hard-solder assembly i demonstrated. A supporting program of reliability measurement by means of high-temperature storage step-stress testing is outlined. (Author)

Descriptors :   *MANUFACTURING, *TRANSISTORS, HIGH TEMPERATURE, PRODUCTION, RELIABILITY, SEMICONDUCTORS, SILICON ALLOYS, THERMAL STRESSES

Distribution Statement : APPROVED FOR PUBLIC RELEASE