Accession Number : AD0411883
Title : RESEARCH AND DEVELOPMENT PROGRAM INTRINSIC RE LIABILITY SUBMINIATURE CERAMIC CAPACITORS.
Descriptive Note : Quarterly rept. no. 4, 1 Mar-31 May 63,
Corporate Author : SPRAGUE ELECTRIC CO NORTH ADAMS MA
Personal Author(s) : Folster, J.H.D. ; Prokopowicz, T.I. ; Tatem, W.A.
Report Date : 31 MAY 1963
Pagination or Media Count : 1
Abstract : Steady-state current-voltage relationships at different temperatures are presented for fresh and degraded C67 Case Size I Monolythic capac itors. The conductivity of fresh capacitors is ohmic, while the conductivity of degraded capac itors is dependent on field strength. A study of possible means of predicting capacitor life is reported. It appears potential early fail ures might be eliminated on the basis of their electrical resistance at an elevated tempera ture after approximately 15 min of electrifi cation if the capacitors are previously sub jected to several days of direct voltage at an elevated temperature. The study suggests early failures are due to minute defects in the ceram ic dielectric films. These defects must be aggravated by more than brief direct voltage ap plication if early failures are to be predicted by a macroscopic type of measurement. The study is continuing.
Descriptors : (*CERAMIC CAPACITORS, SUB), RELIABILITY, TEMPERATURE, LIFE EXPECTANCY, ELECTRICAL CONDUCTIVITY, TESTS, RESISTANCE, ELECTRIC POTENTIAL, DIELECTRIC, DIELECTRIC FILMS, BARIUM ALLOYS, TEST METHODS.
Distribution Statement : APPROVED FOR PUBLIC RELEASE