Accession Number : AD0421460

Title :   A THICKNESS MONITOR FOR THIN FILMS OBTAINED BY VACUUM SPRAYING (INDIKATOR TOLSHCHINY TONKIKH SLOYEV, POLUCHAYEMYKH METODOM VAKUUMNOGO RASPYLENIYA MATERIALOV),

Corporate Author : FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s) : Korsunskiy,A. A. ; Razumnov,I. G.

Report Date : 07 AUG 1963

Pagination or Media Count : 19

Abstract : A device is described which allows one to monitor the thicknesses of thin films (not more than 2 times 10 to the 4th minus 3 times 10 to the 4th angstroms) of a practically unrestricted class of materials obtained by vacuum spraying. It is shown that if the densities of the substances to to be sprayed on are known, it suffices to carry out the calibration just for one material. (Author)

Descriptors :   (*FILMS, THICKNESS), SPRAYS, MEASUREMENT, PIEZOELECTRIC CRYSTALS, RADIOFREQUENCY OSCILLATORS

Distribution Statement : APPROVED FOR PUBLIC RELEASE