
Accession Number : AD0421464
Title : ON SCATTERING AND REFLECTION BY ELLIPTICALLY STRIATED SURFACES,
Corporate Author : SYLVANIA ELECTRONIC SYSTEMSWEST MOUNTAIN VIEW CALIF ELECTRONIC DEFENSE LABS
Personal Author(s) : Burke,J. E. ; Twersky,V.
Report Date : 22 OCT 1962
Pagination or Media Count : 82
Abstract : The general results given previously, for scattering and reflection by rough surfaces, are applied to elliptically striated surfaces, i.e., to random distributions of semielliptic protuberances on a ground plane. Closed forms for the power reflection coefficient R, for the phase of the coherently reflected wave, and for the differential scattering cross section sigma, are obtained by substituting appropriate approximations for the scattering amplitude f of an isolated perfectly conducting semielliptic protuberance. For low frequencies, the real and imaginary parts of the f's required in R and sigma are given explicitly to the eighth and sixth power of the frequency, respectively. At high frequencies an approximation for the isolated scattering amplitude is used which includes the geometrically reflected term and the shadowforming diffracted term; the fields for the distribution show both multiple geometricalreflection effects and multipleshadowing effects. Illustrative numerical examples are given for semiellipses ranging from perpendicular strips, through semicircles, to the limiting case of flat strips. We consider both horizontal and vertical polarization, and all angles of incidence. (Author)
Descriptors : (*SURFACES, SCATTERING), (*REFLECTION, SURFACES), COHERENT SCATTERING, DISTRIBUTION, POWER, LOW FREQUENCY, HIGH FREQUENCY, DIFFRACTION, POLARIZATION, GEOMETRY, ANTENNAS, CYLINDRICAL BODIES
Distribution Statement : APPROVED FOR PUBLIC RELEASE