Accession Number : AD0428785

Title :   ANALYSIS OF IMPURITIES IN SOLID STATE ELECTRONIC MATERIALS.

Descriptive Note : Final rept.,

Corporate Author : TRACERLAB INC WALTHAM MASS

Personal Author(s) : O'Connor,John

Report Date : 01 OCT 1963

Pagination or Media Count : 28

Abstract : Use of gamma ray spectrometry greatly increases speed and flexibility of activation analysis. Detailed separation scheme given for determination of iron, copper, phosphorous and nickel in silicon using ion exchange. Non-destructive analysis of chromium in lasers and masers and gallium in yttrium iron garnets by activation analysis are described. Study of elution of Cu (II) from Dowex 1 resin is presented. (Author)

Descriptors :   (*SEMICONDUCTORS, GAMMA RAY SPECTROSCOPY), (*GAMMA RAY SPECTROSCOPY, SEMICONDUCTORS), (*IMPURITIES, GAMMA RAY SPECTROSCOPY), (*LASERS, GAMMA RAY SPECTROSCOPY), (*MASERS, GAMMA RAY SPECTROSCOPY), NEUTRON ACTIVATION, SILICON, DIAMONDS, SYNTHETIC STONES, RUBY, GARNET, ION EXCHANGE, NONDESTRUCTIVE TESTING, CHEMICAL ANALYSIS, RADIOACTIVATION ANALYSIS

Distribution Statement : APPROVED FOR PUBLIC RELEASE