Accession Number : AD0474076
Title : FAILURE MECHANISMS IN RESISTORS.
Descriptive Note : Interim rept. 2 Feb-31 May 65,
Corporate Author : IIT RESEARCH INST CHICAGO IL
Personal Author(s) : Goldberg, M. E. ; Brennan, W. D. ; Hand, F. R. ; Horberg, A. ; Parikh, N.
Report Date : OCT 1965
Pagination or Media Count : 35
Abstract : Results of research on failure mechanisms in thin metal film resistors are described. Mathematical modeling efforts based on the analysis of available matrix test data are discussed, and experimental means for determining concentration gradients and oxidation rate constants for thin nichrome films are presented. (Author)
Descriptors : (*RESISTORS, FAILURE(ELECTRONICS)), (*METAL FILMS, RESISTORS), MATHEMATICAL MODELS, MATHEMATICAL ANALYSIS, DETERMINATION, OXIDATION, CHROMIUM ALLOYS, NICKEL ALLOYS.
Subject Categories : Electrical and Electronic Equipment
Metallurgy and Metallography
Distribution Statement : APPROVED FOR PUBLIC RELEASE