Accession Number : AD0475621

Title :   MANUFACTURING IN-PROCESS CONTROL AND MEASURING TECHNIQUES FOR INTEGRAL ELECTRONICS.

Descriptive Note : Final rept. 1 Mar 64-15 May 65,

Corporate Author : GENERAL ELECTRIC CO SYRACUSE NY SEMICONDUCTOR PRODUCTS DEPT

Personal Author(s) : Bourdelais, Roger J. ; Elliott, James F.

Report Date : NOV 1965

Pagination or Media Count : 95

Abstract : This report describes a manufacturing methods program which is designed to apply a microscope-television camera-logic circuitry system to specific optical measurement problems for the in-process control of deposited films and the surfaces of semiconductor devices. The goal of this program was to design a system of this type that would provide a more accurate and/or more economic measurement than is presently available. The result of the program was the development of a system that counted the number of imperfections seen in a microscope's field of view. The surface imperfections were pits, mounds, haze, and scratches. The evaluation of the imperfection counter showed that quantitative data on surface imperfections could be available. Also, the importance of the imperfections on yield could be objectively evaluated. As a consequence, higher standards of quality and better yields could be maintained. (Author)

Descriptors :   *INTEGRATED CIRCUITS, *PRODUCTION CONTROL, *DETECTORS, *DEFECTS(MATERIALS), MANUFACTURING, DETECTION, SURFACE PROPERTIES, FILMS, MICROSCOPES, VISUAL INSPECTION, TELEVISION CAMERAS, SEMICONDUCTOR DEVICES, OSCILLATORS, PULSE MODULATION, AMPLIFIERS, EPITAXIAL GROWTH, CRYSTAL DEFECTS, COUNTING METHODS, SURFACES, SUBSTRATES.

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE