Accession Number : AD0476307
Title : ACCELERATED TEST PROGRAM. VOLUME II.
Descriptive Note : Final technical documentary rept. 10 Jun 64-10 Jun 65,
Corporate Author : GENERAL ELECTRIC CO PHILADELPHIA PA MISSILE AND SPACE DIV
Personal Author(s) : Walsh, T. M.
Report Date : 10 JUL 1965
Pagination or Media Count : 118
Abstract : Accelerated step stress and constant stress tests were performed on resistors, capacitors, transistor and diodes. Failure/mechanism studies of each of the parts tested are discussed in detail. A recommended accelerated testing and analysis plan is shown which is applicable to chemical degradation processes found in electronic parts. (Author)
Descriptors : *RESEARCH MANAGEMENT), (*ACCELERATED TESTING, (*ELECTRONIC EQUIPMENT, ACCELERATED TESTING), CHEMICAL ANALYSIS, STRESSES, PERFORMANCE(ENGINEERING), DOCUMENTS, DIODES, CAPACITORS, TRANSISTORS, RESISTORS, FAILURE(MECHANICS), DEGRADATION, ELECTRICAL RESISTANCE, TABLES(DATA), MEASUREMENT.
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE