Accession Number : AD0476307

Title :   ACCELERATED TEST PROGRAM. VOLUME II.

Descriptive Note : Final technical documentary rept. 10 Jun 64-10 Jun 65,

Corporate Author : GENERAL ELECTRIC CO PHILADELPHIA PA MISSILE AND SPACE DIV

Personal Author(s) : Walsh, T. M.

Report Date : 10 JUL 1965

Pagination or Media Count : 118

Abstract : Accelerated step stress and constant stress tests were performed on resistors, capacitors, transistor and diodes. Failure/mechanism studies of each of the parts tested are discussed in detail. A recommended accelerated testing and analysis plan is shown which is applicable to chemical degradation processes found in electronic parts. (Author)

Descriptors :   *RESEARCH MANAGEMENT), (*ACCELERATED TESTING, (*ELECTRONIC EQUIPMENT, ACCELERATED TESTING), CHEMICAL ANALYSIS, STRESSES, PERFORMANCE(ENGINEERING), DOCUMENTS, DIODES, CAPACITORS, TRANSISTORS, RESISTORS, FAILURE(MECHANICS), DEGRADATION, ELECTRICAL RESISTANCE, TABLES(DATA), MEASUREMENT.

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE