Accession Number : AD0479126

Title :   SIMPLIFIED ENGINEERING TECHNIQUES FOR PREDICTING DIODE TREE RESPONSES.

Descriptive Note : Technical rept. 14 Jun-12 Nov 65,

Corporate Author : HUGHES AIRCRAFT CO FULLERTON CA RADIATION EFFECTS RESEARCH DEPT

Personal Author(s) : Bell, J. E. ; Carr, E. A. ; Handley, W. V. ; Walker, K. R.

Report Date : MAR 1966

Pagination or Media Count : 70

Abstract : The purpose of the project is to determine the feasibility of correlating radiation-induced equilibrium photocurrent, in typical silicon switching diodes, to non-destructively measurable diode parameters. Theoretical relations are developed which relate the diode depletion and diffusion components of photocurrent to known physical constants and nondestructively measurable diode electrical parameters. Test circuits and methods are developed for properly measuring the required electrical diode parameters. The agreement between calculated and measured photocurrents for the group of 46 diodes tested established the feasibility of the developed prediction method. (Author)

Descriptors :   (*SEMICONDUCTOR DIODES, NONDESTRUCTIVE TESTING), PHOTOELECTRIC EFFECT, MEASUREMENT, ELECTRICAL PROPERTIES, FEASIBILITY STUDIES, MATHEMATICAL PREDICTION, SILICON, TEST METHODS, TEST EQUIPMENT, DAMAGE, RADIATION EFFECTS, TRANSISTORS, THEORY, AVALANCHE DIODES, VOLTAGE, PULSE GENERATORS, OSCILLATORS, SPECIFICATIONS, CAPACITANCE, LEAKAGE(ELECTRICAL), CAPACITANCE BRIDGES, WIRING DIAGRAMS, DOSIMETERS.

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE