Accession Number : AD0479992

Title :   FLUX-TRAPPING MODEL FOR R-F LOSSES IN SUPERCONDUCTORS.

Descriptive Note : Technical rept.,

Corporate Author : TEXAS UNIV AT AUSTIN LABS FOR ELECTRONICS AND RELATED SCIENCE RESEARCH

Personal Author(s) : Haden, Clovis Roland ; Hartwig, William H.

Report Date : 16 AUG 1965

Pagination or Media Count : 125

Abstract : Measurements on superconductive resonant circuits in the frequency range from 10 - 1000 Mc/sec indicate that flux-trapping of the rf magnetic fields is responsible for residual loss, not predicted by surface resistance theories. A simple model, based on flux-trapping at local sites, predicts such a loss for both type I and type II materials. The surface resistance due to flux-trapping is shown to be proportional to frequency, the density of trapping centers, the penetration depth, and a 'threshold' function of the rf magnetic field. Experimental data are given for several materials, verifying the salient features of the model. It is also concluded that the flux-trapping centers are a common nature. (Author)

Descriptors :   *RESONATORS), (*SUPERCONDUCTORS, HIGH FREQUENCY, VERY HIGH FREQUENCY, ULTRAHIGH FREQUENCY, RADIOFREQUENCY, MAGNETIC FIELDS, SURFACE PROPERTIES, ELECTRICAL RESISTANCE, EXPERIMENTAL DATA, HYSTERESIS, ATTENUATION.

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE