Accession Number : AD0484609
Title : IDENTIFICATION OF MICROSTRUCTURAL CONSTITUENTS AND CHEMICAL CONCENTRATION PROFILES IN COATED REFRACTORY METAL SYSTEMS.
Descriptive Note : Final rept. 1 Jul 64-31 Dec 65,
Corporate Author : GENERAL TELEPHONE AND ELECTRONICS LABS INC BAYSIDE NY BAYSIDE LAB
Personal Author(s) : Bracco, D. J.
Report Date : MAY 1966
Pagination or Media Count : 218
Abstract : Coated refractory metal systems exposed to high temperatures at atmospheric pressure and at low pressures were surveyed to reveal resultant microstructure and chemical concentration profiles for interpretation of coating behavior under high-temperature oxidizing conditions. Identification of the constituents of coatings and substrates before and after oxidation is carried out mainly by electron probe techniques supplemented by x-ray diffraction. Representative substrates chosen for study include the pure metals and alloys based on Cb, Mo, Ta and W. The coatings include a selection of commercially available materials ranging from pure silicides to silicides modified with with one to three additives in trace and bulk amounts. (Author)
Descriptors : *MICROSTRUCTURE), (*REFRACTORY METALS, COATINGS), (*COATINGS, NIOBIUM, SILICIDES, OXIDATION, IDENTIFICATION, PROBES, X RAY DIFFRACTION, SILICON, CHROMIUM, TITANIUM, SILVER, ALUMINUM, MOLYBDENUM, MOLYBDENUM ALLOYS, NIOBIUM ALLOYS, TANTALUM, TANTALUM ALLOYS, TUNGSTEN, CONCENTRATION(CHEMISTRY), DIOXIDES, SILICON COMPOUNDS, TITANIUM COMPOUNDS, PHOTOMICROGRAPHY.
Subject Categories : Properties of Metals and Alloys
Distribution Statement : APPROVED FOR PUBLIC RELEASE