Accession Number : AD0487386
Title : RELIABILITY PHYSICS STUDIES ON TRANSISTORS.
Descriptive Note : Final rept. 25 Nov 64-25 Nov 65,
Corporate Author : ITT SEMICONDUCTOR PALO ALTO CA SHOCKLEY LAB
Personal Author(s) : Schroen, W. ; Woodruff, R. ; Farrington, D. ; Van Loon, P. G. G.
Report Date : JUN 1966
Pagination or Media Count : 150
Abstract : This report is divided into two main sections, both concerned with reliability physics studies on transistors. The first part describes investigations of two surface failure modes, namely surface breakdown phenomena in silicon planar devices, and effects of mobile surface ions located on silicon oxide surfaces. The surface breakdown voltage of a diode can be altered by non-equilibrium carriers which are generated by external illumination or moving in surface channels. A model is investigated which considers the non-equilibrium carriers as additional charges in the space charge region. According to this model, the maximum reduction of breakdown voltage is achieved when the external light spot is shining on the edge of the space charge region. Calculations are presented concerning the influence of non-equilibrium carriers on the breakdown voltage. The investigations of mobile surface ions were concentrated on measurements of the accumulation and the decay of surface ions as a function of time and position as to the junction. The influence of chemical treatment has been studied in detail. Measurements have been performed comparing QA and QK charge values with shifts of the capacitance-voltage curve. Parameters of these measurements were oxide thickness, oxide preparation, and temperature. The results have a direct bearing on the reliability of MOS structures and oxide protected devices. (Author)
Descriptors : (*TRANSISTORS, RELIABILITY(ELECTRONICS)), SEMICONDUCTOR DEVICES, SILICON, FAILURE(ELECTRONICS), OXIDES, VOLTAGE, SPACE CHARGE, ELECTRIC DISCHARGES, SEMICONDUCTOR DIODES, OPTICAL SCANNING, ILLUMINATION, XENON LAMPS, HEAT TREATMENT, THERMAL STABILITY, TEMPERATURE.
Subject Categories : Electrical and Electronic Equipment
Mfg & Industrial Eng & Control of Product Sys
Distribution Statement : APPROVED FOR PUBLIC RELEASE