Accession Number : AD0603706

Title :   A MEASUREMENT TECHNIQUE FOR VACUUMDEPOSITED THIN FILMS,

Corporate Author : ARMY ELECTRONICS LABS FORT MONMOUTH N J

Personal Author(s) : Newman,Phillip A. ; Sette,Richard F.

Report Date : APR 1964

Pagination or Media Count : 26

Abstract : This report presents a laboratory method for the measurement of evaporated thin films in the range 10 to 10,000 Angstroms. Utilizing a multiple beam technique, employing fringes of equal chromatic order and a unique sample holder, films have been measured to a precision of = 15 A. The simplicity of the components employed is an outstanding feature of the experimental system. (Author)

Descriptors :   (*FILMS, MEASUREMENT), INTERFEROMETERS, THICKNESS, VAPOR PLATING, VACUUM APPARATUS, LABORATORY EQUIPMENT, OPTICAL EQUIPMENT, MONOCHROMATIC LIGHT

Distribution Statement : APPROVED FOR PUBLIC RELEASE