Accession Number : AD0606036

Title :   A CORRECTION TO THIN-FILM HEAT TRANSFER MEASUREMENTS,

Corporate Author : AEROSPACE CORP EL SEGUNDO CALIF

Personal Author(s) : Hartunian,Richard A. ; Varwig,Robert L.

Report Date : 01 MAY 1961

Pagination or Media Count : 8

Abstract : A technique for measuring the temperature dependence of the product of the density, thermal conductivity, and heat capacity of various substrates for thin film resistance thermometers is described. The results for pyrex, quartz, and plate glass, which have been used as backing materials for thin film resistance thermometers, indicate that sizeable errors may be encountered in inferring heat transfer rates from measured surface temperature histories if the thermal properties are assumed constant. The corrections which must be applied to account for the temperature dependence of the thermal conductivity and the specific heat were established through a theoretical solution of the nonlinear one-dimensional heat conduction equation. The magnitude of the correction depends on the material of the substrate and the surface temperature. For pyrex at 150C it is about 45% and for fused quartz and glass about 15%. (Author)

Descriptors :   (*HEAT TRANSFER, MEASUREMENT), (*RESISTANCE THERMOMETERS, CALIBRATION), (*METAL FILMS, THERMAL PROPERTIES), DENSITY, THERMAL CONDUCTIVITY, SPECIFIC HEAT, GLASS, QUARTZ

Distribution Statement : APPROVED FOR PUBLIC RELEASE