Accession Number : AD0607638

Title :   RESEARCH ON X-RAY DETERMINATION OF PRECISION LATTICE PARAMETERS.

Descriptive Note : Final rept.,

Corporate Author : PHILIPS LABS INC IRVINGTON-ON-HUDSON N Y

Personal Author(s) : Parrish,William ; Mack,Marian ; Taylor,Jeanne

Report Date : 30 JUN 1962

Pagination or Media Count : 81

Abstract : The application of the centroid method to powder line profiles obtained with the X-ray diffractometer is shown to lead to lattice parameters which are independent of the diffraction angle. Thus it appears that the lattice parameter is free of systematic errors and that the centroid method has properly accounted for the aberrations which distort and shift the line profile. The instrumentation and methodology necessary for results of the highest precision are discussed. The effect of interferences from the Kalpha3,4 satellites and Kbeta lines is described. Three different methods that have been proposed for the determination of centroids were investigated and applied to both spectral and powder line profiles, and the necessity for 'equivalence' between the centroids of the spectral profile and the line profile is discussed. The line shapes and the centroids of observed and analytic spectral profiles are compared for both CuKalpha and FeKalpha radiations. (Author)

Descriptors :   (*CRYSTAL LATTICES, X RAY DIFFRACTION), CRYSTAL STRUCTURE, LINE SPECTRA, SPECTROSCOPY, CENTER OF GRAVITY, POTASSIUM, TUNGSTEN, ERRORS

Distribution Statement : APPROVED FOR PUBLIC RELEASE