Accession Number : AD0608961

Title :   EXPLORATORY DEVELOPMENT OF THE Q-FACTOR TECHNIQUE.

Descriptive Note : Quarterly progress letter no. 2 for period ending 30 Sep 64,

Corporate Author : BENDIX CORP SOUTHFIELD MICH

Personal Author(s) : Frank,Max

Report Date : 10 OCT 1964

Pagination or Media Count : 47

Abstract : The effort in geometry normalization was extended by determining base transit times for very high current injection and examining transistor types other than the 2N1613. Temperature and current dependencies, operating and measurement, were investigated during two gamma tests and a neutron test. Irradiations were made on 2N1613 type transistors in the gamma and neutron tests, while the 2N709 and 2N914 were also tested in the neutron environment. The results of the two gamma tests and the experiment relating to active-passive irradiation conditions in the neutron test are described.

Descriptors :   (*TRANSISTORS, RADIATION EFFECTS), SILICON, GAMMA RAYS, GAIN, DEGRADATION, NEUTRON SPECTRUM, GAMMA RAY SPECTRA, RADIATION MEASURING INSTRUMENTS

Distribution Statement : APPROVED FOR PUBLIC RELEASE