Accession Number : AD0609859

Title :   FIELD ION MICROSCOPY OF IRON WHISKERS.

Descriptive Note : Final rept.,

Corporate Author : PENNSYLVANIA STATE UNIV UNIVERSITY PARK

Personal Author(s) : Muller,Erwin M. ; Nishikawa,Osamu

Report Date : NOV 1964

Pagination or Media Count : 26

Abstract : Further investigation of the imaging properties of neon in the field ion microscope revealed that the large dif ference between the neon and helium images of iron whiskers is due to the efficient energy transfer in the collision of neon atoms having polarization energy with the surface metal atoms. Whiskers which had been grown under various conditions at Materials Central were observed by the field ion microscope. It was found that the whiskers grown in the ultra-pure system had a low density of lattice defects and impurities. Some whiskers were observed with the help of an image intensifier. (Author)

Descriptors :   (*IRON, SINGLE CRYSTALS), (*SINGLE CRYSTALS, IRON), (*ELECTRON MICROSCOPY, FIELD EMISSION), (*FIELD EMISSION, ELECTRON MICROSCOPY), NEON, HELIUM, IONIZATION, POLARIZATION, CRYSTAL DEFECTS, EVAPORATION, TUNGSTEN, CRYSTAL STRUCTURE, CRYSTAL GROWTH, IMPURITIES, FIBER METALLURGY, MICROSTRUCTURE

Distribution Statement : APPROVED FOR PUBLIC RELEASE