Accession Number : AD0610006

Title :   X-RAY SCATTERING BY POINT-DEFECTS.

Descriptive Note : Final technical rept.,

Corporate Author : PARIS UNIV (FRANCE)

Personal Author(s) : Levelut,A. M. ; Guinier,A.

Report Date : 1962

Pagination or Media Count : 28

Abstract : A device is described which was designed to detect the diffuse X-ray scattering caused by point defects in a crystal. Tests concerning the sensitivity of the apparatus are summarized, as are results of its application to problems involving the degree of order in diffuse solid solutions and the effects of irradiation on crystals.

Descriptors :   (*CRYSTAL DEFECTS, X RAY DIFFRACTION), (*X RAY DIFFRACTION, INSTRUMENTATION), SCATTERING, SOLID SOLUTIONS, ALUMINUM ALLOYS, GALLIUM ALLOYS, COPPER ALLOYS, ZINC ALLOYS, LITHIUM COMPOUNDS, FLUORIDES, SILICON, FRANCE

Distribution Statement : APPROVED FOR PUBLIC RELEASE