Accession Number : AD0617542
Title : CHARACTERISTIC ENERGY LOSSES IN LAYERED METALLIC THIN FILMS.
Descriptive Note : Technical rept. for 1 Feb 64-31 Jan 65,
Corporate Author : DELAWARE UNIV NEWARK DEPT OF PHYSICS
Personal Author(s) : Axelrod,N. N.
Report Date : 31 JAN 1965
Pagination or Media Count : 121
Abstract : The characteristic electron energy loss spectra of layered films of Bi and Mg have been measured using a retarding potential electron energy analyzer with an electrically differentiated output to obtain the energy loss distribution directly. A new loss, that was not observed on single layer films of Mg or Bi, was found at 12.9 = 0.2 e.v. This loss can be interpreted as a surface plasma loss at the metal-metal interface. A surface loss in Al-Mg films was not reproducible, but a new loss was observed at 26.4 e.v. which can be interpreted as a single Al loss (15.4 ev) plus a single Mg loss (10.9 ev). Chemical and physical processes such as changes in composition and aggregation at the Al-Mg interface during both the preparation and measurement of the sample may alter the interface enough to decrease the intensity of the surface plasma loss. (Author)
Descriptors : (*METAL FILMS, ELECTRICAL PROPERTIES), (*SOLID STATE PHYSICS, METAL FILMS), SURFACE PROPERTIES, ENERGY, ATTENUATION, ELECTRONS, MOTION, BISMUTH, MAGNESIUM, ALUMINUM, THEORY, QUANTUM THEORY, PLASMAS(PHYSICS), EXCITATION
Distribution Statement : APPROVED FOR PUBLIC RELEASE