Accession Number : AD0617582

Title :   THE THICKNESS OF MOVING HELIUM II FILM,

Corporate Author : ROYAL MILITARY COLL OF CANADA KINGSTON (ONTARIO) DEPT OF PHYSICS

Personal Author(s) : Gribbon,P. W. F. ; Jackson,L. C.

Report Date : 04 FEB 1963

Pagination or Media Count : 10

Abstract : The thickness of moving liquid helium II films was measured using the polarized light method developed by Burge and Jackson. The moving film was that on the outside of a cylindrical stainless steel beaker emptying by creep at the rate corresponding to the temperature for the two cases 1.68 K and 1.83 K. Measured at a height of 1 cm above the outer level of the liquid the thicknesses were 5.6% and 4.5% less than those of the stationary film at 1.68K and 1.83K respectively. The observations are compared with the theoretical expressions for the difference in thickness of stationary and moving films derived by Kontorovich and by Franchetti. (Author)

Descriptors :   (*HELIUM, FILMS), (*FILMS, THICKNESS), CRYOGENICS, LIQUEFIED GASES, POLARIZATION

Distribution Statement : APPROVED FOR PUBLIC RELEASE