Accession Number : AD0617715

Title :   PHYSICS OF FAILURE IN ELECTRONICS. VOLUME III,

Corporate Author : IIT RESEARCH INST CHICAGO ILL

Personal Author(s) : Goldberg,M. F. ; Vaccaro,Joseph

Report Date : 1964

Pagination or Media Count : 494

Abstract : The proceedings of the 1964 symposium on the physics of failure in electronics held at the Illinois Institute of Technology in Chicago are presented. Papers are presented on: Test, analysis, and correlation; Surface effects; Principles and applications; Effects in films; Bulk effects.

Descriptors :   (*RELIABILITY(ELECTRONICS), SYMPOSIA), ELECTRONIC EQUIPMENT, DEGRADATION, AGING(MATERIALS), TEST METHODS, SURFACE PROPERTIES, FILMS, TRANSISTORS, CAPACITORS, DIODES, IMPURITIES, NOISE(RADIO), SEMICONDUCTOR DEVICES, SEMICONDUCTING FILMS

Distribution Statement : APPROVED FOR PUBLIC RELEASE