Accession Number : AD0619226

Title :   ANALYSIS OF THE RESISTIVE LAYER TRANSDUCER,

Corporate Author : HARRY DIAMOND LABS WASHINGTON D C

Personal Author(s) : Scales,John L. ,III.

Report Date : 15 JUN 1965

Pagination or Media Count : 23

Abstract : In a piezoelectric semiconductor, a surface layer of high resistivity material is driven by an alternating electric field, while the conducting substrate is mechanically coupled but not driven electrically. This analysis shows the response of the composite system, giving the behavior with frequency and effects due to loading. For reasonable (low) values of the attenuation constant, it is shown that the effect of the substrate is to lower the amplitude of vibration but leave the resonant frequency almost unchanged. An assumption, which limits the analysis, is that the proportionality constant between stress and rate of change of strain is independent of frequency. (Author)

Descriptors :   (*PIEZOELECTRIC TRANSDUCERS, SEMICONDUCTORS), (*SEMICONDUCTORS, PIEZOELECTRIC EFFECT), VIBRATION, ULTRASONIC RADIATION, PIEZOELECTRIC CRYSTALS, RESONANCE, DIFFERENTIAL EQUATIONS, BOUNDARY VALUE PROBLEMS, MATHEMATICAL ANALYSIS

Distribution Statement : APPROVED FOR PUBLIC RELEASE