Accession Number : AD0620548

Title :   STATISTICS OF SECONDARY ELECTRON EMISSION.

Descriptive Note : Quarterly technical status rept. no. 2, 1 Mar-31 May 65,

Corporate Author : TRINITY COLL DUBLIN (IRELAND) PHYSICAL LAB

Personal Author(s) : Delaney,C. F. G.

Report Date : 18 JUN 1965

Pagination or Media Count : 9

Abstract : The problem of backscattering from silicon detectors is considered.

Descriptors :   (*SECONDARY EMISSION, STATISTICAL ANALYSIS), (*SEMICONDUCTOR DEVICES, SECONDARY EMISSION), SILICON, ELECTRONS, SCATTERING, ELECTRON MULTIPLIERS

Distribution Statement : APPROVED FOR PUBLIC RELEASE