Accession Number : AD0622558

Title :   A METHOD FOR DETERMINATION OF BROADENED X-RAY DIFFRACTION MAXIMA.

Descriptive Note : Technical rept.,

Corporate Author : SPRINGFIELD ARMORY MASS

Personal Author(s) : Erard,R. Robert

Report Date : 17 SEP 1965

Pagination or Media Count : 49

Abstract : An investigation was conducted to develop and evaluate an empirical method of determining the angular location of the K-alpha 1 peak of diffraction lines irrespective of the degree of resolution of the K-alpha 1 doublet. The empirical method is based upon the angular separation and intensity ratio between the two components of the K-alpha doublet. The presently used angular measures of diffraction maxima have precisions of measurement which are tolerable only when the K-alpha doublet is either well resolved or completely merged. The utility and precision of measurement are compared for the determination of lattice parameters, residual stresses, and microstresses by the empirical and customary methods, especially for completely merged doublets, to establish the general applicability of the empirical method. (Author)

Descriptors :   (*X RAY DIFFRACTION, OPTIMIZATION), CRYSTAL LATTICES, STRESSES, MEASUREMENT, DIFFRACTION ANALYSIS, TENSILE PROPERTIES, TANTALUM ALLOYS, TUNGSTEN ALLOYS

Distribution Statement : APPROVED FOR PUBLIC RELEASE