Accession Number : AD0622819

Title :   CRYOGENICS MEMORY PLANE INTERCONNECTION TECHNIQUES.

Descriptive Note : Final rept. for May 64-May 65,

Corporate Author : INTERNATIONAL BUSINESS MACHINES CORP POUGHKEEPSIE N Y

Personal Author(s) : Rosenberger,J. ; Lindquist,A. B. ; Seeber,R. R.

Report Date : OCT 1965

Pagination or Media Count : 208

Abstract : Several factors which are key to the success of a Cryotron Associative Processor (CAP) were studied in detail. CAP control circuits and several types of comparator cells were built and tested. Intraplanar coupling techniques were evaluated and a low inductance method was successfully demonstrated. Ladder circuit resolution times were theoretically analyzed and the analysis confirmed experimentally. A three-plane model was built with partial success. A tester was build with a two-fold purpose: a. To exercise the model in an associative manner. b. To evaluate the adequacy of the system design resulting from the use of the simple comparator cell. (Author)

Descriptors :   (*CRYOGENIC STORAGE DEVICES, ELECTRIC CONNECTORS), (*ELECTRIC CONNECTORS, CRYOGENIC STORAGE DEVICES), COMPUTER LOGIC, COUPLING CIRCUITS, SUPERCONDUCTORS, VAPOR PLATING, INDUCTANCE, SWITCHING CIRCUITS

Distribution Statement : APPROVED FOR PUBLIC RELEASE